IEEE Std 18:2002 pdf free download

IEEE Std 18:2002 pdf free download.IEEE Standard for Shunt Power Capacitors.
7.1.3 Test practIces
The following condiions for testing shall be used:
a) New and clean capacitors shall be used for each test.
b) Anibiern temperature shall be 25 °C ± 5 °C.
c) All alternating-current voltages shall have a frequency of 50 lIz or ) Hz and be approximately sinusoidal in wave shape.
7.2 Short-tIme overvoltage tests (production test)
Each capacitor shall withstand the following test voltages for at least 10 s. Test voltages shall be applied in such a manner as to avoid transients.
7.2.1 Terminal-to-termInal test
Each capacitor shall, with its case and internal temperature at 25 °C ± 5 °C. withstand for at least tO s a terrninal-to1erminal insulation test at a standard test voltage of either of the following:
a) A direct current test voltage of 43 times rated (rms) voltage, or
b) An alternating sinusoidal voltage of two times rated (rrns) voltage.
For three-phase wye-connected units where there is a neutral bushing or the neutral is connected to the case. the above testing for terminal-to-neutral shall be followed by a test at the square root of 3 times the above standard test voltage between each pair of bushings (not including any neutral bushing) to test the phase-to- phase insulation.
For three-phase wye-connected units where there is no neutral bushing and the neutral is not connected to the case, the rated voltage is the phase-to-phase voltage of the capacitor unit. In order to test both the phase- to-phase insulation and each leg of the wye at the appropriate voltage, the test voltage shall be 1.16 times the above standard test voltage between each pair of bushings (2 + square root of three 1.16).
For three-phase delta connected units, the rated voltage is the phase-to-phase voltage of the capacitor unit. The test voltage shall be the above standard test voltage between each pair of bushings.
The capacitance shall be measured on each unit both before and after the application of the Lest voltage. The initial capacitance measurement shall be at low voltage. The change in capacitance, as a result of the test voltage, shall be less than either a value ol 2% of the originally measured capacitance or that caused by failure of a single clement of the particular design, whichever is smaller.
7.2.2 Terminals-to-case test (not applicable to capacitors having one terminal common to the case)
Terminals-to-case tests shall be made on capacitors having all terminals insulated from the case. The appropriate test voltage from Table 6 shall be applied for at lea%t 10 s between all insulated terminals connected together and the case.